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Modules / Tools

Tools

All tools in one place: the Hub's own calculators and utilities, and an index of the tools engineers use across the industry. Usable without sign-in. Sign in to save your inputs and subscribe to MPW shuttle alerts.

Hub utilities

Die per wafer

Gross-die yield off wafer size, die size and edge exclusion.

SoC Specification & ArchitectureFoundry & MaskProduction Ramp & Yield
Yield estimate

Poisson-model gross-die yield from defect density.

SoC Specification & ArchitectureProduction Ramp & Yield
Package / ASIC cost

Parametric per-unit cost: silicon, package, test, NRE.

SoC Specification & ArchitecturePackaging & Test
Chip cost calculator

Full AI-accelerator cost bridge: logic die, HBM, packaging and test.

SoC Specification & Architecture
Packaging model

Compare CoWoS-S, CoWoS-L, EMIB, SoIC and flip-chip cost and HBM-stack support.

Packaging & TestInterposer & Substrate Design
Cost bridge chart

Side-by-side manufacturing cost comparison across AI accelerators.

SoC Specification & Architecture
Price / performance frontier

Compare accelerators on cost, throughput and TCO.

SoC Specification & Architecture
Allocation dashboard

Foundry, CoWoS and HBM allocation status across fabs and process nodes.

Foundry & MaskProduction Ramp & Yield
Tapeout decision workspace

Guided workflow for fabless teams evaluating a tapeout: definition through go/no-go.

Physical Design & Sign-offTape-out
Unit converter

mm, mil, µm, inch, cm: the ones you actually convert between.

Chat with Datasheets

Upload a PDF, ask questions with page citations, extract and compare parameters. Paid plans.

SoC Specification & ArchitectureIP Specification & Architecture
Product type classifier

Classify a change into one of the Hub's ten product types and see its obligations, deliverables and gates.

SoC Specification & Architecture
Design review assistant

Upload a schematic or BOM PDF for a general sanity check: not a substitute for real DRC/ERC tooling. Paid plans.

Bring-up & Silicon Validation
EBITDA calculator

Net income plus interest, taxes, depreciation and amortization, with margin.

ROI calculator

Return on investment, plus an annualized rate over a holding period.

CAGR calculator

Compound annual growth rate between a beginning and ending value.

Business case calculator

COGS, ASP, margin, breakeven, NRE payback, NPV/IRR and TAM/SAM/SOM for a semiconductor product: savable, with an AI viability narrative.

SoC Specification & Architecture
Product and project planner

Plan, schedule and track a programme on any Hub lifecycle: Gantt chart with critical path, baselines, RAID log, change control, gate reviews, role reports and MS Project XML export. Paid plans.

SoC Specification & ArchitectureTape-out

Where along the chip lifecycle the utilities help

How many Hub utilities are tagged to each lifecycle stage, in the order the stages run. Select a stage to see its utilities.

Engineering tools

Calculators, worksheets and planners for the work along the chip lifecycles, each on its own page with its method, assumptions and sources. Calculators are free to use; worksheets, checklists, trackers and planners are for members.

Cost and business

Mask, wafer, test and bill of materials costs, sourcing choices and end-of-life buys.

Reliability

Failure rates, stress tests, qualification plans and radiation effects.

Quality statistics

Process capability, measurement systems, control charts and test limits.

Quality worksheets

FMEA, control plans, 8D, traceability and the other records audits ask for.

Safety and security

Functional safety metrics, integrity levels, threat and vulnerability ratings.

Digital and physical design

Power, thermal, area, interconnect and the design records engineers keep.

Analog, RF, photonics and packaging

Converters, RF chains, matching, links and package electrical limits.

Manufacturing, fab and supply

Capacity, equipment, cleanrooms, spares and supply decisions.

AI, systems and startup

AI compute sizing, certification, schedules, pipelines and company finance.

Industry tools index

183 of 4,606 tools, ranked by how many roles use each one. Category and company are a best-effort match on the tool's name, not a hand-curated taxonomy.

Open source only 135Includes the open-source chip-design tools from IIC-OSIC-TOOLS (JKU Linz) and Efabless, each with a description.
PDF Solutions Exensio 30ETQ Reliance 11Medini Analyze 6ICP-MS 5Galaxy Semiconductor Examinator 5APIS IQ-FMEA 5Atomic Force Microscope 4ReliaSoft Weibull++ 4Hamamatsu PHEMOS Emission Microscope 4Bruker Dimension AFM 4· BrukerSparta TrackWise 3KLA Klarity 3· KLAScanning acoustic microscopy 3Isograph Reliability Workbench 2Nordson SAM acoustic microscopes 2· NordsonJEOL TEM 2· JEOLEllipsometer and reflectometer 2Nanoindenter 2Exensio and yieldWerx yield analytics 2Nikon and Zeiss 3D X-ray CT 2· NikonSpectroscopic ellipsometer 2CD-SEM (Hitachi CG series) 2· HitachiMedini Analyze for safety analysis 2ZEISS Crossbeam FIB-SEM 2· ZeissExensio yield analytics 2Zeiss SEM with EDX 2· ZeissHitachi High-Tech CD-SEM 2· HitachiThermo Fisher Helios FIB 2Zeiss PROVE and IPRO registration metrology 1· ZeissKeyence vision measurement 1· KeyenceFour-point probe and profilometer 1Keyence optical measurement systems 1· KeyenceBruker (Rave) nm-series nanomachining repair tools 1· BrukerZeiss SEM and EDX 1· ZeissZeiss and Hitachi SEM 1· HitachiGTEM / TEM Cells 1KLA Teron reticle inspection 1· KLARigaku TXRF and VPD-ICP-MS 1onto Innovation / Camline yield systems 1· Onto InnovationKLA Surfscan monitor wafer inspection 1· KLAZeiss AIMS and AIMS EUV aerial image systems 1· ZeissKLA Klarity and Exensio defect databases 1· KLABruker XRD 1· BrukerNikon and Nordson X-ray inspection 1· NikonZeiss TEM/FIB 1· ZeissOnto Innovation Atlas and Dragonfly 1· Onto InnovationHitachi High-Tech CD-SEM CG/CV series 1· HitachiHitachi High-Tech review SEM 1· HitachiKLA defect inspection and SEM review 1· KLAKLA Surfscan / Candela 1· KLAKLA 2935 / 39xx brightfield and Puma darkfield 1· KLAKLA Candela and Surfscan 1· KLAThermo Fisher Talos TEM and atom probe tomography 1FTIR and quadrupole mass spectrometry gas analysers 1Rudolph / Onto Innovation bump metrology 1· Onto InnovationZeiss AIMS EUV / AIMS 193i printability review 1· ZeissParticle counters and KLA Surfscan 1· KLAZeiss and Thermo Fisher X-ray / FIB analysis 1· ZeissExensio and yieldWerx test data analytics 1Lasertec SiC defect inspection 1
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