Outlier screening (PAT) limit calculator
Set static and dynamic part average testing limits from robust statistics, flag the outliers in your data and see the yield the screen removes.
Quality statisticsFree to useHow it worksSourcesWhere it helps
Fills the inputs below with typical figures. Replace any of them with your own.
- Static PAT limits
- no low limit to 170.01 µA
- Robust mean (median) 120.45, robust sigma 8.259 µA, from 48 parts
- Static PAT outliers
- 2 of 48
- 41,670 ppm, 4.167% of parts
- Dynamic PAT outliers
- 2 of 48
- 41,670 ppm, static plus per lot limits
- Mean and standard deviation outliers
- 0 of 48
- no low limit to 235.38 µA
- Yield lost to the dynamic screen
- 4.167%
- Expected from a normal population at this k: 0.000987 ppm
- Outside the specification
- 0
- Already fail the data sheet limits; not counted as outliers
Check these
- Static limits here come from 1 lot. The AEC guideline expects reference data from several lots (six or more); check the current revision before using these as production limits.
- The standard deviation (18.65) is much larger than the robust sigma (8.259): outliers or a long tail are inflating it, so limits from the mean and standard deviation would be too wide.
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| Method | Limits (µA) | Outliers | Rate (ppm) | Yield lost |
|---|---|---|---|---|
| Static PAT (robust) | no low limit to 170.01 | 2 | 41,670 | 4.167% |
| Dynamic PAT (static plus each lot) | no low limit to 166.89 | 2 | 41,670 | 4.167% |
| Mean and standard deviation | no low limit to 235.38 | 0 | 0 | 0.000% |
| Lot | Parts | Passing parts used | Robust mean (µA) | Dynamic limits (µA) | Outliers |
|---|---|---|---|---|---|
| All | 48 | 46 | 120 | no low limit to 166.89 | 2 |
µA. Bins holding a limit, or flagged parts, are marked.
- 101.6 to 107.12
- 107.1 to 112.56
- 112.5 to 11811
- 118 to 123.512
- 123.5 to 128.99
- 128.9 to 134.44
- 134.4 to 139.92
- 139.9 to 145.40
- 145.4 to 150.80
- 150.8 to 156.30
- 156.3 to 161.80
- 161.8 to 167.20
- 167.2 to 172.70static high limit
- 172.7 to 178.20
- 178.2 to 183.70
- 183.7 to 189.10
- 189.1 to 194.60
- 194.6 to 200.111 flagged
- 200.1 to 205.50
- 205.5 to 21111 flagged
Show the data as a table
| Item | Parts |
|---|---|
| 101.6 to 107.1 | 2 |
| 107.1 to 112.5 | 6 |
| 112.5 to 118 | 11 |
| 118 to 123.5 | 12 |
| 123.5 to 128.9 | 9 |
| 128.9 to 134.4 | 4 |
| 134.4 to 139.9 | 2 |
| 139.9 to 145.4 | 0 |
| 145.4 to 150.8 | 0 |
| 150.8 to 156.3 | 0 |
| 156.3 to 161.8 | 0 |
| 161.8 to 167.2 | 0 |
| 167.2 to 172.7 | 0 |
| 172.7 to 178.2 | 0 |
| 178.2 to 183.7 | 0 |
| 183.7 to 189.1 | 0 |
| 189.1 to 194.6 | 0 |
| 194.6 to 200.1 | 1 |
| 200.1 to 205.5 | 0 |
| 205.5 to 211 | 1 |
| Line in the data | Lot | Value (µA) | Flagged by |
|---|---|---|---|
| 47 | All | 196 | Static |
| 48 | All | 211 | Static |
How it works
Part average testing (PAT) removes parts that pass the data sheet limits but sit far from the rest of the population, because such parts are more likely to fail early in the field. This tool sets static and dynamic PAT limits from robust statistics, flags the outliers in the data you paste and shows the yield the screen removes.
- Estimate the centre and spread robustly. A few outliers would distort a plain mean and standard deviation, so the guideline uses the median as the robust mean and the inter-quartile range as the basis of a robust sigma. For a normal population the inter-quartile range is about 1.349 standard deviations, and the guideline rounds the divisor to 1.35.
robust mean = median; robust sigma = (Q3 − Q1) / 1.35 - Static limits from a reference population. Static limits come from a reference population of parts that pass the specification, ideally several lots, and stay fixed. They sit k robust sigmas either side of the robust mean, with k equal to 6 by default. A limit is never allowed to be wider than the specification limit. For a one sided parameter such as IDDQ only the high limit is used.
static low = max( median − k x robust sigma, LSL ); static high = min( median + k x robust sigma, USL ) - Dynamic limits for each lot. Dynamic PAT repeats the calculation on the lot being tested, using the lot's own parts that pass the specification and the static limits. A lot that has shifted gets limits centred on its own population, so an outlier inside the static limits is still found. The dynamic limits are applied together with the static limits.
dynamic limits per lot = median ± k x robust sigma of the lot's passing parts; a part fails if it is outside either set of limits - Compare with the mean and standard deviation. For comparison the tool also sets limits at the plain mean plus or minus k sample standard deviations from the same reference parts. When outliers are present the standard deviation is inflated and these limits widen, which is why the robust method is preferred.
plain limits = mean ± k x s - Count the outliers. An outlier is a part inside the specification but outside a set of limits. Parts outside the specification already fail and are counted apart. The yield lost to the screen is the outlier count over the parts tested; a normal population is expected to lose very little at k of 6.
outlier rate (ppm) = 1,000,000 x outliers / parts tested; expected false flags = sides x Φ(−k) - Long tailed parameters. Leakage and IDDQ are often close to lognormal. The optional logarithm transform applies the same method to log10 of the values and reports the limits back in measured units.
Assumptions
- The reference population is a single roughly normal population after the optional logarithm. Data from different populations, such as two wafer fabs, should be screened apart.
- The reference parts are representative of production, and parts outside the specification are removed from the reference by default.
- Quartiles are found by linear interpolation. The inclusive and exclusive conventions can differ in small samples, so the choice is offered.
- A part flagged by the screen is treated as an outlier for yield purposes; what to do with it (scrap, downgrade, extra stress) is a business decision for the product.
Limits and warnings
- Fewer than about 30 parts, or fewer than the several lots the guideline expects, make the limits unreliable. The tool warns but still computes.
- The method does not cover spatial screens such as good die in a bad neighbourhood, or multivariate screens.
- The 1.35 divisor assumes a normal population. For skewed data it is only approximate, and the logarithm or a different distribution is a better route.
- The tool takes values as pasted. Tester resolution, unit mistakes and retests are for you to check in the source data.
- Customer requirements may set the value of k, the reference lots or the action on outliers. Follow them where they differ from this tool.
Sources
The methods and default figures rest on these public sources. The wording here is our own; read the source for its full text.
- AEC-Q001 Rev-D, Guidelines for Part Average Testing, Automotive Electronics Council, Component Technical Committee, 9 December 2011. Static and dynamic PAT limits, the median and inter-quartile range based robust statistics, and the rule that limits are not wider than the specification. Free from the AEC website. This is the revision found; the AEC site lists the current one.
- AEC-Q002, Guidelines for Statistical Yield Analysis, Automotive Electronics Council, Component Technical Committee, Current revision on the AEC website. Cited by name only, for the related statistical yield and bin limit screens.
- Interquartile Range, Dataplot Reference Manual (opens in a new tab), National Institute of Standards and Technology, Information Technology Laboratory, Accessed 25 October 2026. For a normal distribution the inter-quartile range is about 1.349 times the standard deviation, which is the basis of the robust sigma.
Where it helps
The lifecycle stages this tool serves: 1 stage in 1 lifecycle.
More quality statistics tools
Method notev1Formula, ranges, sources and limits
Sets static and dynamic part average testing limits from robust statistics for pasted test data, and counts the outliers and the yield the screen removes.
Formula
robust mean = median; robust sigma = (Q3 − Q1) / 1.35; static low = max( median − k x robust sigma, LSL ); static high = min( median + k x robust sigma, USL ); dynamic limits per lot = median ± k x robust sigma of the lot's passing parts; a part fails if it is outside either set of limits; plain limits = mean ± k x s; outlier rate (ppm) = 1,000,000 x outliers / parts tested; expected false flags = sides x Φ(−k)
| Input | Unit | Range it holds for | Comes from |
|---|---|---|---|
| Transform | choice | none, log10 | Your figure |
| Screen | choice | both, high, low | Your figure |
| Lower specification limit | measured units | any | Your figure |
| Upper specification limit | measured units | any | Your figure |
| Multiple k of the robust sigma | x sigma | 1 to 12 | Your figure |
| Divisor of the inter-quartile range | factor | 1 to 2 | Your figure |
| Quartile convention | choice | inclusive, exclusive | Your figure |
| Reference lots for static limits, 0 for all | lots | from 0 | Your figure |
| Drop parts outside the specification from the reference | choice | yes, no | Your figure |
Outputs: Static low limit (measured units); Static high limit (measured units); Static PAT outliers (parts); Dynamic PAT outliers (parts); Mean and standard deviation outliers (parts); Outlier rate, dynamic PAT (ppm).
Assumptions
- The reference population is a single roughly normal population after the optional logarithm. Data from different populations, such as two wafer fabs, should be screened apart.
- The reference parts are representative of production, and parts outside the specification are removed from the reference by default.
- Quartiles are found by linear interpolation. The inclusive and exclusive conventions can differ in small samples, so the choice is offered.
- A part flagged by the screen is treated as an outlier for yield purposes; what to do with it (scrap, downgrade, extra stress) is a business decision for the product.
Uncertainty: The arithmetic is exact for the data entered. The limits are only as representative as the reference parts; with fewer than about 30 parts they can move a great deal with one value.
Known limits
- Fewer than about 30 parts, or fewer than the several lots the guideline expects, make the limits unreliable. The tool warns but still computes.
- The method does not cover spatial screens such as good die in a bad neighbourhood, or multivariate screens.
- The 1.35 divisor assumes a normal population. For skewed data it is only approximate, and the logarithm or a different distribution is a better route.
- The tool takes values as pasted. Tester resolution, unit mistakes and retests are for you to check in the source data.
- Customer requirements may set the value of k, the reference lots or the action on outliers. Follow them where they differ from this tool.
Where the method comes from
The robust mean, robust sigma and k sigma limits described in the AEC-Q001 guideline for part average testing, with the Hub's own per lot dynamic limits, logarithm option and outlier count.
Reference example, checked by test: Worked example in this method note: the values 10 to 20 in steps of 1 and one outlier at 60 (12 parts). Inclusive quartiles are 12.75 and 18.25 with a median of 15.5, so the robust sigma is 5.5 / 1.35 = 4.0741 and, with k of 3.5, the limits are 15.5 ± 14.2593. The one outlier at 60 is flagged; the plain mean and standard deviation limits (18.75 ± 3.5 x 13.37) reach 65.6 and miss it. Static low limit 1.24074; Static high limit 29.7593; Static PAT outliers 1; Dynamic PAT outliers 1; Mean and standard deviation outliers 0; Outlier rate, dynamic PAT 83,333.3.
Versions
- v1 (2026-10-25): First version, built from the tool idea.
Terms on this page
- DPAT
- A PAT variant in which the outlier limits are recomputed for each wafer or lot from that population's own distribution, rather than fixed from historical data.
- Yield
- The share of manufactured units that meet specification, counted at a given step: line yield through the fab, die yield at wafer sort, and assembly and final test yield after packaging.
- PAT
- A screening method that fails devices whose parametric measurements sit far from the population mean, typically beyond six robust standard deviations, even though they pass the datasheet limits.
- Datasheet
- The authoritative customer-facing document giving a part's electrical characteristics, absolute maximum ratings, timing, pinout, package drawing and ordering information.
- IDDQ
- A test that measures the static supply current with the circuit in a settled state, on the premise that a defect-free CMOS design draws almost none.
- Lot
- The unit of material movement in a fab: a group of wafers, conventionally up to 25, that travel together through the process flow and share a lot number, run card and dispatch priority.
- Wafer
- A thin, polished disc of single-crystal silicon on which hundreds or thousands of identical circuits are built at the same time.
- GDBN
- A spatial screen that rejects a passing die because too many of its immediate neighbours on the wafer failed, on the reasoning that a local defect cluster makes the survivor suspect.
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