Test limit and guard band calculator
Set test limits inside the specification for measurement uncertainty, and see the false accept and false reject rates and the yield each guard band costs.
Quality statisticsFree to useHow it worksSourcesWhere it helps
Fills the inputs below with typical figures. Replace any of them with your own.
- Test limits
- -1.7 to 1.7 mV
- Multiple of U. Guard band 0.3 low, 0.3 high mV
- False accept rate (PFA)
- 0.634 ppm
- Bad parts that pass, of all parts tested
- False reject rate (PFR)
- 0.129%
- Good parts that fail, of all parts tested
- Shipped escapes
- 0.635 DPPM
- Out of specification, of the parts that pass
- Test yield
- 99.863%
- True yield 99.991%
- Yield lost to the guard band
- 0.121%
- Against testing at the specification limits
- Uncertainty
- u 0.15, U 0.3 mV
- Test uncertainty ratio 6.67
- Process capability
- Cpk 1.27
- Before any measurement error
- Specific risk at the test limit
- 0.090% and 0.132% out of specification
- A part reading exactly on the limit passes with this chance of being bad; one just failing is good with the complement
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| Method | Test limits (mV) | Guard band (mV) | False accept (PFA) | Shipped DPPM | False reject (PFR) | Test yield | Yield lost |
|---|---|---|---|---|---|---|---|
| No guard band | -2 to 2 | 0 / 0 | 23.2 ppm | 23.2 | 0.010% | 99.983% | 0.000% |
| Multiple of U | -1.7 to 1.7 | 0.3 / 0.3 | 0.634 ppm | 0.635 | 0.129% | 99.863% | 0.121% |
| Target false accept | -2 to 2 | 0 / 0 | 23.2 ppm | 23.2 | 0.010% | 99.983% | 0.000% |
| JCGM 106 specific risk | -1.86737 to 1.84937 | 0.1326 / 0.1506 | 5.79 ppm | 5.79 | 0.040% | 99.952% | 0.032% |
Show the data as a table
| Guard band (multiple of U) | PFA (ppm of parts tested) |
|---|---|
| 0 | 23.2 |
| 0.125 | 17.38 |
| 0.25 | 12.48 |
| 0.375 | 8.574 |
| 0.5 | 5.623 |
| 0.625 | 3.515 |
| 0.75 | 2.09 |
| 0.875 | 1.181 |
| 1 | 0.6336 |
| 1.13 | 0.3222 |
| 1.25 | 0.1552 |
| 1.38 | 0.07079 |
| 1.5 | 0.03053 |
| 1.63 | 0.01245 |
| 1.75 | 0.004795 |
| 1.88 | 0.001744 |
| 2 | 0.0005989 |
| 2.13 | 0.000194 |
| 2.25 | 0.00005929 |
| 2.38 | 0.00001708 |
| 2.5 | 0.00000464 |
| 2.63 | 0.000001188 |
| 2.75 | 0.0000002865 |
| 2.88 | 0.0000000651 |
| 3 | 0.00000001393 |
Show the data as a table
| Guard band (multiple of U) | PFR (% of parts tested) |
|---|---|
| 0 | 0.01027 |
| 0.125 | 0.01505 |
| 0.25 | 0.02153 |
| 0.375 | 0.03014 |
| 0.5 | 0.04142 |
| 0.625 | 0.05601 |
| 0.75 | 0.07472 |
| 0.875 | 0.0985 |
| 1 | 0.1285 |
| 1.13 | 0.1662 |
| 1.25 | 0.2133 |
| 1.38 | 0.2717 |
| 1.5 | 0.3438 |
| 1.63 | 0.4325 |
| 1.75 | 0.5409 |
| 1.88 | 0.6728 |
| 2 | 0.8325 |
| 2.13 | 1.025 |
| 2.25 | 1.255 |
| 2.38 | 1.53 |
| 2.5 | 1.856 |
| 2.63 | 2.242 |
| 2.75 | 2.694 |
| 2.88 | 3.223 |
| 3 | 3.838 |
| Guard band (x U) | Guard band (mV) | Test limits (mV) | PFA (ppm) | Shipped DPPM | PFR (%) | Test yield (%) |
|---|---|---|---|---|---|---|
| 0 | 0 | -2 to 2 | 23.2 | 23.2 | 0.01027 | 99.983 |
| 0.125 | 0.0375 | -1.9625 to 1.9625 | 17.38 | 17.38 | 0.01505 | 99.978 |
| 0.25 | 0.075 | -1.925 to 1.925 | 12.48 | 12.48 | 0.02153 | 99.971 |
| 0.375 | 0.1125 | -1.8875 to 1.8875 | 8.574 | 8.577 | 0.03014 | 99.962 |
| 0.5 | 0.15 | -1.85 to 1.85 | 5.623 | 5.626 | 0.04142 | 99.951 |
| 0.625 | 0.1875 | -1.8125 to 1.8125 | 3.515 | 3.517 | 0.05601 | 99.936 |
| 0.75 | 0.225 | -1.775 to 1.775 | 2.09 | 2.092 | 0.07472 | 99.917 |
| 0.875 | 0.2625 | -1.7375 to 1.7375 | 1.181 | 1.183 | 0.0985 | 99.893 |
| 1 | 0.3 | -1.7 to 1.7 | 0.6336 | 0.6345 | 0.1285 | 99.863 |
| 1.13 | 0.3375 | -1.6625 to 1.6625 | 0.3222 | 0.3228 | 0.1662 | 99.825 |
| 1.25 | 0.375 | -1.625 to 1.625 | 0.1552 | 0.1556 | 0.2133 | 99.778 |
| 1.38 | 0.4125 | -1.5875 to 1.5875 | 0.07079 | 0.07099 | 0.2717 | 99.72 |
| 1.5 | 0.45 | -1.55 to 1.55 | 0.03053 | 0.03064 | 0.3438 | 99.648 |
| 1.63 | 0.4875 | -1.5125 to 1.5125 | 0.01245 | 0.0125 | 0.4325 | 99.559 |
| 1.75 | 0.525 | -1.475 to 1.475 | 0.004795 | 0.004822 | 0.5409 | 99.451 |
| 1.88 | 0.5625 | -1.4375 to 1.4375 | 0.001744 | 0.001756 | 0.6728 | 99.319 |
| 2 | 0.6 | -1.4 to 1.4 | 0.0005989 | 0.000604 | 0.8325 | 99.159 |
| 2.13 | 0.6375 | -1.3625 to 1.3625 | 0.000194 | 0.0001961 | 1.025 | 98.967 |
| 2.25 | 0.675 | -1.325 to 1.325 | 0.00005929 | 0.00006005 | 1.255 | 98.736 |
| 2.38 | 0.7125 | -1.2875 to 1.2875 | 0.00001708 | 0.00001735 | 1.53 | 98.461 |
| 2.5 | 0.75 | -1.25 to 1.25 | 0.00000464 | 0.000004728 | 1.856 | 98.135 |
| 2.63 | 0.7875 | -1.2125 to 1.2125 | 0.000001188 | 0.000001215 | 2.242 | 97.75 |
| 2.75 | 0.825 | -1.175 to 1.175 | 2.865e-7 | 2.945e-7 | 2.694 | 97.297 |
| 2.88 | 0.8625 | -1.1375 to 1.1375 | 6.510e-8 | 6.727e-8 | 3.223 | 96.769 |
| 3 | 0.9 | -1.1 to 1.1 | 1.393e-8 | 1.449e-8 | 3.838 | 96.154 |
| Part | Divisor | Standard uncertainty (mV) |
|---|---|---|
| Expanded uncertainty / k | 2 | 0.15 |
| Combined, root sum square | 0.15 |
How it works
A test cannot see the true value of a parameter, only a reading that carries measurement uncertainty. Near a specification limit that means some bad parts pass (false accept) and some good parts fail (false reject). This tool sets test limits inside the specification, a guard band, and shows what each choice does to escapes, to yield and to the risk for a part that reads right on the limit.
- Combine the measurement uncertainty. Enter the uncertainty as an expanded value with its coverage factor, as a standard uncertainty, or build it from the tester accuracy limit (turned into a standard uncertainty by the divisor for its distribution), the repeatability and the reference standard. The parts add as a root sum square. The expanded uncertainty is the standard uncertainty times the coverage factor.
u = sqrt( (accuracy / divisor)^2 + repeatability^2 + (reference U / reference k)^2 ); U = k x u; TUR = (USL − LSL) / (2 U) - Model the true value and the reading. The true value X of a part follows the process distribution (normal, mean μ, standard deviation σ). The reading is Y = X + offset + e, where the error e is normal with standard deviation u. X and Y are then a bivariate normal pair with correlation ρ = σ / sqrt(σ^2 + u^2).
X ~ N(μ, σ^2); Y = X + offset + e; e ~ N(0, u^2) - Set the test limits. The test limits sit inside the specification limits by a guard band g: the lower test limit is LSL + g and the upper is USL − g. The method decides g. None sets g to zero. The simple rule sets g to a multiple of U, and a multiple of 1 is the stringent acceptance rule of ISO 14253-1. The target rule searches for the smallest g whose false accept rate (global PFA) or shipped escape rate meets your target. The JCGM 106 specific risk rule places each test limit where a part reading exactly on it has the target probability of being out of specification.
AL = LSL + g; AH = USL − g; target rule: smallest g with PFA(g) ≤ target; specific rule: P(X outside specification | Y = test limit) = α - Global risks by integration. The global false accept and false reject rates are probabilities over the whole population of parts. For a given true value x the chance of passing is Φ((AH − x − offset) / u) − Φ((AL − x − offset) / u). Multiplying by the process density and integrating over the values that are out of specification gives PFA; integrating the chance of failing over the values that are in specification gives PFR. The integral is done numerically, closed form where the chance of passing is 0 or 1 and Simpson's rule near the limits.
PFA = ∫ over x outside [LSL, USL] of f(x) P(pass | x) dx; PFR = ∫ over x inside [LSL, USL] of f(x) P(fail | x) dx - Specific risks at the test limit. A specific risk belongs to one reading rather than the population. With the process distribution as the prior, the true value of a part that reads y is normal with a mean pulled towards the process mean and a smaller spread. The specific false accept risk is the chance that such a part is out of specification; the specific false reject risk of a part that fails by the same reading is the chance that it is in specification. A flat prior uses y alone with spread u.
X | Y = y ~ N( μ + κ (y − μ − offset), κ u^2 ), κ = σ^2 / (σ^2 + u^2) - Yields and shipped escapes. True yield is the share of parts inside the specification. Test yield is the share that pass. The yield lost to the guard band is the drop in test yield against testing at the specification limits. The shipped escape rate is the share of passing parts that are out of specification.
true yield = P(LSL ≤ X ≤ USL); test yield = P(AL ≤ Y ≤ AH); shipped DPPM = 1,000,000 x PFA / test yield
Assumptions
- The process distribution of the true value is normal. Real parameters with long tails or several populations need their own distribution, so treat tail results as indicative.
- The measurement error is normal with the combined standard uncertainty, independent of the true value, and the same for every part.
- An accuracy limit from a tester data sheet is not a standard deviation. The divisor for its assumed distribution (rectangular by default) turns it into one.
- A tester offset is an uncorrected systematic error and the guard band does not compensate for it. If it is known, subtract it from the reading.
- The guard band is the same at both limits for the multiple of U and the target rules. The JCGM 106 specific risk rule can place the two limits differently.
Limits and warnings
- The result is only as good as the process mean, process standard deviation and uncertainty entered. Use values from a capability study and the tester's own uncertainty budget.
- Only one parameter is considered. Several parameters each tested against its own guard band need their escape rates added.
- Retests, multiple measurements and averaging of readings change the effective uncertainty. Enter the uncertainty of the decision reading.
- The numerical integration covers about 10 process standard deviations and 9 standard uncertainties either side of each limit. Risks below about 1e-15 are not resolved.
- A guard band does not make a test good. If the test uncertainty ratio is low, the better remedies are a better test, a longer test or fewer parts near the limit.
Sources
The methods and default figures rest on these public sources. The wording here is our own; read the source for its full text.
- JCGM 106:2012, Evaluation of measurement data: The role of measurement uncertainty in conformity assessment (opens in a new tab), Joint Committee for Guides in Metrology (BIPM), 2012. Specific and global consumer's and producer's risks, acceptance intervals and guard bands. Free from BIPM; adopted as ISO/IEC Guide 98-4.
- ISO 14253-1, Geometrical product specifications (GPS), Inspection by measurement of workpieces and measuring equipment, Part 1: Decision rules for verifying conformity or nonconformity with specifications, International Organization for Standardization, 2017 edition. Cited by name and part only. The simple guard band of one expanded uncertainty is described from the general practice of stringent acceptance; read the standard for its present default rule.
- A Guard-Band Strategy for False-Accept Management (opens in a new tab), Keysight Technologies (Dobbert), also published in NCSLI Measure, 2008. Guard bands chosen to hold the false accept probability at a target, with the false reject cost.
- NCSLI Recommended Practice RP-18 (section on the 4 to 1 test uncertainty ratio requirement), NCSL International, Current edition. Cited by name only. Discusses why a 4 to 1 test uncertainty ratio alone does not control the false accept risk.
Where it helps
The lifecycle stages this tool serves: 3 stages in 3 lifecycles.
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Method notev1Formula, ranges, sources and limits
Sets test limits inside the specification for a measurement uncertainty and a process distribution, and reports the global false accept and false reject rates, the shipped escape rate and the yield the guard band costs.
Formula
u = sqrt( (accuracy / divisor)^2 + repeatability^2 + (reference U / reference k)^2 ); U = k x u; TUR = (USL − LSL) / (2 U); X ~ N(μ, σ^2); Y = X + offset + e; e ~ N(0, u^2); AL = LSL + g; AH = USL − g; target rule: smallest g with PFA(g) ≤ target; specific rule: P(X outside specification | Y = test limit) = α; PFA = ∫ over x outside [LSL, USL] of f(x) P(pass | x) dx; PFR = ∫ over x inside [LSL, USL] of f(x) P(fail | x) dx; X | Y = y ~ N( μ + κ (y − μ − offset), κ u^2 ), κ = σ^2 / (σ^2 + u^2); true yield = P(LSL ≤ X ≤ USL); test yield = P(AL ≤ Y ≤ AH); shipped DPPM = 1,000,000 x PFA / test yield
| Input | Unit | Range it holds for | Comes from |
|---|---|---|---|
| Specification type | choice | two, lower, upper | Your figure |
| Lower specification limit | measured units | any | Your figure |
| Upper specification limit | measured units | any | Your figure |
| Uncertainty entered as | choice | expanded, standard, build | Your figure |
| Expanded uncertainty U | measured units | from 0 | Your figure |
| Coverage factor k | factor | 1 to 4 | Your figure |
| Standard uncertainty u | measured units | from 0 | Your figure |
| Tester accuracy limit | measured units | from 0 | Your figure |
| Distribution of the accuracy limit | choice | rect, tri, norm2, norm3 | Your figure |
| Repeatability, one sigma | measured units | from 0 | Your figure |
| Reference standard expanded uncertainty | measured units | from 0 | Your figure |
| Reference standard coverage factor | factor | 1 to 4 | Your figure |
| Tester offset | measured units | any | Your figure |
| Process mean | measured units | any | Your figure |
| Process standard deviation | measured units | from 0 | Your figure |
| Guard band method | choice | none, multiple, target, jcgm | Your figure |
| Guard band as a multiple of U | x U | 0 to 5 | Your figure |
| Target applies to | choice | pfa, dppm | Your figure |
| Target false accept rate | ppm or % | from 0 | Your figure |
| Target unit | choice | ppm, pct | Your figure |
| Specific risk target | % | 0 to 50 | Your figure |
| Prior for specific risk | choice | process, flat | Your figure |
Outputs: Lower test limit (measured units); Upper test limit (measured units); Global false accept rate (PFA) (fraction of parts); Global false reject rate (PFR) (fraction of parts); Shipped escapes (DPPM); Test yield (fraction); True yield (fraction); Yield lost to the guard band (fraction).
Assumptions
- The process distribution of the true value is normal. Real parameters with long tails or several populations need their own distribution, so treat tail results as indicative.
- The measurement error is normal with the combined standard uncertainty, independent of the true value, and the same for every part.
- An accuracy limit from a tester data sheet is not a standard deviation. The divisor for its assumed distribution (rectangular by default) turns it into one.
- A tester offset is an uncorrected systematic error and the guard band does not compensate for it. If it is known, subtract it from the reading.
- The guard band is the same at both limits for the multiple of U and the target rules. The JCGM 106 specific risk rule can place the two limits differently.
Uncertainty: The integration is accurate to better than one part in a million of the risk for a reasonable ratio of uncertainty to process spread. The result is as good as the uncertainty and process figures entered; a non normal process can change tail risks by a large factor.
Known limits
- The result is only as good as the process mean, process standard deviation and uncertainty entered. Use values from a capability study and the tester's own uncertainty budget.
- Only one parameter is considered. Several parameters each tested against its own guard band need their escape rates added.
- Retests, multiple measurements and averaging of readings change the effective uncertainty. Enter the uncertainty of the decision reading.
- The numerical integration covers about 10 process standard deviations and 9 standard uncertainties either side of each limit. Risks below about 1e-15 are not resolved.
- A guard band does not make a test good. If the test uncertainty ratio is low, the better remedies are a better test, a longer test or fewer parts near the limit.
Where the method comes from
Follows JCGM 106:2012, Evaluation of measurement data: The role of measurement uncertainty in conformity assessment (opens in a new tab). The platform's version departs from it as follows.
- Only normal process and error distributions are offered. Why: Keeps the integral fast and the inputs few; JCGM 106 allows any distribution.
- The target rule and the multiple of U rule are added beside the JCGM 106 specific risk rule. Why: Test engineers set limits by a multiple of U or by a false accept target, so these are shown side by side.
Reference example, checked by test: Worked example in this method note: a one sided lower limit at the process mean with a standard uncertainty equal to the process sigma gives correlation 1/sqrt(2). The orthant probabilities of a bivariate normal pair then give a false accept and a false reject rate of 1/4 − arcsin(1/sqrt(2)) / (2 pi) = 1/8 each. Global false accept rate (PFA) 0.125; Global false reject rate (PFR) 0.125; Test yield 0.5; True yield 0.5; Yield lost to the guard band 0.
Versions
- v1 (2026-10-25): First version, built from the tool idea.
Terms on this page
- Yield
- The share of manufactured units that meet specification, counted at a given step: line yield through the fab, die yield at wafer sort, and assembly and final test yield after packaging.
- Guard band
- The deliberate margin between the test limit and the datasheet limit, set to absorb measurement uncertainty, tester-to-tester variation and expected drift over life.
- ISO
- The worldwide federation of national standards bodies that publishes consensus standards across industries, including the automotive functional safety and cybersecurity standards that govern semico...
- PFA
- The destructive phase of failure analysis, in which the located site is exposed by decapsulation, delayering or cross-sectioning and then imaged and analysed with optical, electron and ion beam tec...
- Datasheet
- The authoritative customer-facing document giving a part's electrical characteristics, absolute maximum ratings, timing, pinout, package drawing and ordering information.
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