Querying the manufacturing and test data warehouse: joining lot, wafer, die and unit level records across MES, WAT/PCM, sort and final test, with window functions and aggregation to build yield, parametric and traceability views.
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Note from the research register: Learned on the job against the company's yield database with help from the data engineering team; generic SQL courses cover syntax but not the schema semantics that matter.
Register version 1.