Generating the structural test patterns with automatic test pattern generation (stuck-at, transition and, where the plan asks, cell-aware and path delay patterns), adding memory BIST, boundary scan and instrument access patterns, capturing functional patterns from verification, converting all of them to the tester's format and simulating them against the netlist with tester timing.
This stage with its neighbours. Each row is a discipline active here, shaded by how mature its work is by the end of each stage.
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