Term · Test & DFT
Structural test
Testing that targets the physical netlist through fault models and scan access rather than exercising the chip's intended function. It is the basis of production digital test because coverage can be measured objectively and patterns generated automatically.
- Type
- Term
- Domain
- Test & DFT, ATPG and fault models
Notes
Functional test, by contrast, runs real instruction or protocol sequences and is now used mostly at system-level test to catch what structural test misses.
Related terms
- ATPG
- Scan chain
- Functional test
- Fault coverage
Part of the Test & DFT glossary, with every term in the topic and the lifecycles, tools and standards that use them.
Where it appears on the Hub
Used on 4 pages of the Hub. In each group, the pages that mention it most come first.
Lifecycle stages and gates
Skills
Suggest an improvement
Suggest an improvement to this entry
A clearer definition, an example, a correction or a source an editor can check. Editors review every suggestion before the entry changes.
Last reviewed: not yet reviewed in depth. Entry last updated . The full glossary