Generating and closing structural test patterns with Tessent, TetraMAX or Modus: scan-chain and compression setup, stuck-at, transition and cell-aware fault models, DRC clean-up, pattern count versus coverage tradeoffs, and X-handling.
No statement on what tools can do has been recorded for this skill yet.
The Hub knows of no registered course, programme or certification for this skill yet.
Note from the research register: DFT role over one or more tapeouts, with vendor ATPG training and the fault-model literature behind it.
Register version 1.