Applying JMP specifically to statistical inference on silicon data: Fit Model with mixed effects for lot and wafer nesting, variability and capability platforms, control chart builder, DOE design and analysis, and predictive screening of parametric versus yield relationships.
No statement on what tools can do has been recorded for this skill yet.
The Hub knows of no registered course, programme or certification for this skill yet.
Note from the research register: Learned in yield, test or process engineering with JMP training plus mentoring from someone who understands the statistics behind the platforms, not just the menus.
Register version 1.