Chip lifecycle / Checklists / Chiplet lifecycle / Tape-out, Wafer Sort & Known-Good Die: entry checklist

Tape-out, Wafer Sort & Known-Good Die: entry checklist

Use when wafer sort of each die starts. Run by the known-good-die test engineer.

1. Inputs

MustThe multi-die sign-off and the multi-die tape-out gates have been passed.
Evidence
Tape-out decision record
Owner
Programme manager
SeeFlow: Decision records
MustThe known-good-die test strategy is final for each die.
Evidence
Known-good-die test strategy
Owner
Known-good-die test engineer
MustTest patterns and the test access description are delivered for each die.
Evidence
Test patterns and test access description
Owner
DFT architect

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