Term · Test & DFT
N-detect test
A pattern generation strategy that detects each target fault N different times through different propagation paths and value combinations, rather than stopping at the first detection.
The extra diversity catches defects the single-detect pattern happened to miss.
- Also known as
- Multiple-detect ATPG
- Type
- Term
- Domain
- Test & DFT, ATPG and fault models
Notes
Pattern count grows roughly linearly with N, so it is usually reserved for high-reliability parts or applied only to selected fault regions.
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