The released program that runs on production test equipment to screen every unit of the product, with its test flow, limits, trim and calibration steps, binning and correlation evidence.
Test Work product in the Analog and mixed-signal lifecycle, the AI accelerator lifecycle, the MEMS and sensors lifecycle, the Industrial and energy electronics lifecycle, the FPGA chip development lifecycle, the Structured ASIC lifecycle and the Product lifecycle
It decides which units ship and in which grade, carrying the product's quality promise into every unit. An unreleased program lets limits drift from the datasheet, leaves coverage gaps that let defects escape and leaves test cost uncontrolled. In AMS, MEMS and industrial lifecycles it includes analog trimming or sensor calibration; in the AI accelerator lifecycle it includes high power and thermal screening.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.