Design for test to RTL design
DFT reports scan rule violations, untestable logic, test point requests and test mode issues traced to the RTL, so design fixes them while the RTL can still change.
- Work products passed
- Scan and BIST logic
- DFT architecture
- Bug reports
Register or sign in to read on
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.