Term · Memory & Storage
Soft error
A transient bit flip caused by an alpha particle or cosmic ray neutron strike rather than a permanent defect, so rewriting the location restores correct operation.
Rates are quoted in failures in time per megabit and rise with altitude.
- Also known as
- SEU, Single event upset, transient fault, Transient fault
- Type
- Term
- Domain
- Memory & Storage, Memory reliability
- Also relevant to
- Reliability & Quality, Safety & Security
Notes
SRAM is generally more soft-error prone per bit than modern DRAM, which is why large caches carry their own ECC.
Related terms
Part of the Memory & Storage glossary, with every term in the topic and the lifecycles, tools and standards that use them.
Where it appears on the Hub
Used on 3 pages of the Hub. In each group, the pages that mention it most come first.
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