Acronym · Reliability & Quality
SEU (Single Event Upset)
A soft error in which one strike flips the state of a memory cell, flip-flop or latch. The corrupted bit persists until rewritten and can be corrected by error correcting codes or redundancy rather than by repair.
- Also known as
- Bit flip
- Type
- Acronym
- Domain
- Reliability & Quality, Radiation and soft errors
Notes
Multi-bit upsets from one particle became common once cells shrank below roughly 65 nm, forcing interleaved ECC layouts.
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