Acronym · Reliability & Quality
SEL (Single Event Latch-up)
A destructive event in which an ionising particle triggers the parasitic thyristor in a CMOS structure, producing a self-sustaining high current path that persists until power is removed and can permanently damage the die.
- Type
- Acronym
- Domain
- Reliability & Quality, Radiation and soft errors
Notes
The main reason space and avionics parts specify latch-up immune processes such as epitaxial substrates, triple well or silicon on insulator.
Related terms
Part of the Reliability & Quality glossary, with every term in the topic and the lifecycles, tools and standards that use them.
Where it appears on the Hub
No other page of the Hub uses this term yet.
Suggest an improvement
Suggest an improvement to this entry
A clearer definition, an example, a correction or a source an editor can check. Editors review every suggestion before the entry changes.
Last reviewed: not yet reviewed in depth. Entry last updated . The full glossary