Diagnosing failing scan patterns down to candidate defect locations: using tester failure logs with ATPG diagnosis tools to produce ranked callout nets or cells, distinguishing systematic from random defects, and feeding candidates to physical FA.
No statement on what tools can do has been recorded for this skill yet.
The Hub knows of no registered course, programme or certification for this skill yet.
Note from the research register: DFT, product or yield engineering role handling sort fails; vendor diagnosis tool training plus repeated FA correlation cycles.
Register version 1.