The report of yield and defect performance at the new fab during ramp: line yield, die yield, defect density by layer, top loss mechanisms and progress against the yield learning plan.
Report Work product in the Fab build and equipment qualification lifecycle
Yield determines how many sellable die the ramp delivers and the true cost per die. Judged on wafer output alone, a ramp never tackles its top loss mechanisms in order and can be declared complete before yield is competitive.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.