The pass and fail limits applied to each production test, derived from the specification, characterisation and guard bands.
Test Work product in the Analog and mixed-signal lifecycle, the Test program and ATE development lifecycle and the MEMS and sensors lifecycle
Limits decide which parts ship. Limits set too loose let bad parts through; too tight waste good parts and raise cost. In test program and MEMS lifecycles they also drive bin plans and calibration.
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