The report that presents reliability stress test results, failure analysis and lifetime conclusions to show that a product or process meets its reliability requirements. Used for photonic products and for process qualification at a new fab.
Report Work product in the Hard IP lifecycle, the Silicon photonics and optical interconnect lifecycle and the Fab build and equipment qualification lifecycle
It is the evidence that the product or process will last in use. Production cannot be released without it, customers have nothing to approve against, and quality controls lose their anchor in measured failure mechanisms. In the photonics lifecycle it combines laser, fibre attach and electronic reliability; in the fab build lifecycle it shows that the transferred process gives the same reliability at the new fab.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.