Before the yield readiness gate, the yield enhancement lead confirms learning is on the curve, losses are understood and owned, and spread is within kit limits.
MustThe defect density trend is plotted by lot against the planned learning curve, with layers shown separately.
MustEach of the top loss mechanisms in the defect Pareto has a root cause or a stated hypothesis, an owner and an action.
MustMemory fail bit classifications are linked to physical causes for the dominant signatures.
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