A time series of defect density on the new node, measured from test chips, yield structures and inspection, showing how fast defectivity is being reduced towards the level needed for volume production.
Report Work product in the Process technology (node) lifecycle
It shows whether yield learning is on track to support customer production at the planned time. A yield readiness decision based on a single snapshot notices slowing learning late, and ramp commitments to customers rest on hope.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.