Acronym · Test & DFT
STUMPS (Self-Test Using MISR and Parallel Shift Register Sequence Generator)
The classic logic BIST architecture in which a pseudo-random source feeds many parallel scan chains through a phase shifter and their outputs are compacted into a MISR.
Almost all modern LBIST implementations are STUMPS variants.
- Type
- Acronym
- Domain
- Test & DFT, Built-in self-test
Notes
Developed at IBM in the early 1980s and still the reference architecture taught and implemented forty years later.
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