Standard · Standards & Organisations
JEP122 (Failure Mechanisms and Models for Semiconductor Devices)
The JEDEC publication that catalogues intrinsic wear-out and extrinsic failure mechanisms with the acceleration models and activation energies used to extrapolate accelerated stress results to field lifetime.
It is the reference for reliability lifetime calculations.
- Also known as
- JEP, JEDEC Publication
- Type
- Standard
- Domain
- Standards & Organisations, Test & reliability standards
Notes
JEP documents are guidance publications rather than binding standards, but JEP122 models underpin nearly every FIT rate claim.
Related terms
Part of the Standards & Organisations glossary, with every term in the topic and the lifecycles, tools and standards that use them.
Where it appears on the Hub
Used on 3 pages of the Hub. In each group, the pages that mention it most come first.
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