Operating and interpreting SEM for semiconductor work: imaging mode and detector selection, accelerating voltage and charging control, voltage contrast for electrical fault localization, EDX for composition, and CD/defect measurement on prepared samples.
No statement on what tools can do has been recorded for this skill yet.
The Hub knows of no registered course, programme or certification for this skill yet.
Note from the research register: FA, metrology or process lab role with substantial hands-on SEM column time; vendor training plus apprenticeship with a senior microscopist.
Register version 1.