The report that fixes the expected production yield for a product at each insertion once volume is stable, with the loss breakdown, variation and the basis used for limits and planning.
Report Work product in the Test program and ATE development lifecycle and the Silicon photonics and optical interconnect lifecycle
It gives a stable reference for monitoring, statistical limits and capacity planning. Without it, excursions cannot be judged against normal behaviour and plans rely on early, unstable yields. Photonics lifecycles use the same baseline for wafer-level optical test.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.