The analysis and choice of test sockets for final test, matched to the package, electrical needs, handler, insertion life and temperature range, with the evaluation results behind the choice.
Analysis Work product in the Test program and ATE development lifecycle
It picks the socket that contacts parts reliably at the speed and temperature needed. Without a careful selection, contact failures cause false yield loss, high speed or RF tests do not correlate and sockets wear out faster than planned.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.