The report of tests that push the power device to abnormal conditions, such as short-circuit withstand, unclamped inductive switching, surge current and repetitive avalanche, with failure points and margins.
Report Work product in the Power and compound semiconductor lifecycle
It shows how much electrical abuse the device survives and exactly where it fails. Ruggedness ratings such as short-circuit withstand time are otherwise guesses, early reliability concerns go unfound and customers discover the device's limits in their own systems after a fault.
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