Yield, parametric, inline and product test data collected from wafers built during risk production, used to finalise models, controls and the decision to release volume production.
Record or register Work product in the Process technology (node) lifecycle
It is the first evidence of how the process behaves at production pace on real products. Production models, control limits and volume release decisions would otherwise rely on test chip data that does not reflect product behaviour.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.