The review of the macro's design and layout for reliability before freeze: protection against electrostatic discharge, latch-up spacing and guard rings, electromigration on the power and signal wiring, and ageing effects on circuit performance.
Report Work product in the Hard IP lifecycle
Reliability problems found on silicon or in an integrator's product are slow and costly to fix in a hard macro. Reviewing the design and layout before freeze catches the common causes while they can still be changed, and shapes the qualification plan.
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