The test results for every device or module tested in production, including parametric values, bins, screening outcomes and test conditions, collected by lot and wafer for yield and quality analysis.
Record or register Work product in the Power and compound semiconductor lifecycle
It is the evidence of what was shipped and the main source for yield and cost reporting. Complete production test data makes yield losses analysable, lets outlier screening work and traces customer complaints back to lots and test conditions.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.