Chip lifecycle / Work products / Process test structure data

Process test structure data

Measurements on dedicated test structures, such as loss cut-back structures, ring resonators, modulator and detector test cells, used to characterise the photonics platform and build its PDK and models.

Record or register Work product in the Silicon photonics and optical interconnect lifecycle

Why it exists and what it decides

It is the raw evidence behind every model, library component and design rule in the PDK. Compact models and component libraries fitted to too little data underestimate variation, and designs built on the PDK miss their targets on real wafers.

Decisions it informs

Whether enough data exists to release the PDK, library and compact models
Which device parameters vary too much and need design margin
Whether more test structures or wafers are needed

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