The reduced and reordered set of scan, memory and functional patterns that keeps the required coverage while cutting test time, produced from test time and test removal analysis.
Test Work product in the Test program and ATE development lifecycle
It lowers test time without giving up the defect detection customers depend on. Without a controlled optimisation, patterns are cut by guesswork, coverage drops unnoticed and escapes rise.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.