Patterns that run the chip's memory built-in self-test engines on the tester, selecting algorithms, memories and conditions, and reading back pass, fail and repair information.
Test Work product in the Test program and ATE development lifecycle
It screens embedded memories, which often hold most of the chip's transistors, and enables repair that recovers yield. Without good patterns, memory defects escape, repairable dies are scrapped and memory failures cannot be diagnosed.
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