Results of stress and life tests on the laser sources as integrated in the product, showing drift in power, wavelength and threshold, failures and the lifetime they support.
Report Work product in the Silicon photonics and optical interconnect lifecycle
Laser wear-out often limits the life of a photonic module. Reliability data on the integrated laser supports the lifetime claim, closes a gap in the reliability qualification report and finds failure modes in the lab rather than in customer systems.
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