The plan for spare probe cards, load boards, sockets and consumable parts needed to keep production test running, based on usage, failure rates, lead times and remaining product life.
Plan Work product in the Test program and ATE development lifecycle
It prevents production stopping because a worn or broken item has no replacement. Without it, a single damaged probe card can halt a product line for the length of its lead time.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.