Records of cleaning, repair, calibration, replacement and usage counts for each probe card, load board and socket in production, linked to yield and test data so hardware problems can be spotted early.
Record or register Work product in the Test program and ATE development lifecycle
It keeps test hardware in condition so that yield reflects the silicon, not worn pins or contacts. Without it, worn hardware causes false failures and retests, good parts are scrapped and problems are blamed on the product.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.