A report comparing measured electro-optic behaviour on wafer, such as modulator bandwidth, detector responsivity and receiver response, with what the co-simulation and compact models predicted.
Report Work product in the Silicon photonics and optical interconnect lifecycle
It confirms that the models used to design the electronics and optics can be trusted for the next design and for setting test limits. Uncorrelated models carry their errors into the next design spin, overstate link margin and leave the known good die criteria resting on assumptions nobody has checked against wafer data.
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