The first measurements of a new chip's key parameters across voltage, temperature and a small set of samples, taken on the tester or bench soon after first silicon and before full characterisation.
Record or register Work product in the Test program and ATE development lifecycle
It gives the first view of where the silicon sits against its specification. Without it, preliminary limits, correlation work and the characterisation plan proceed without knowing which parameters are marginal, and design problems are reported later than they could be.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.