The specification of what test data is recorded for each part, wafer and lot, the formats and naming used, and how data is identified, stored and transferred to analysis systems.
Specification Work product in the Test program and ATE development lifecycle
It makes test data usable for yield, quality and adaptive test. Without it, data from different programs or sites cannot be compared, units cannot be traced and analysis is slowed by format clean-up.
The full lifecycle detail, with its charts, flows, tables and every section, is for registered members. Registration is free and takes a minute. You come back to this page afterwards.