1. Purpose of the gate
Patterns converted and simulated confirms that every pattern set the program needs exists in the tester's format and has passed simulation against the final netlist with tester timing, with coverage recorded against the goal.
It is closely tied to the chip's DFT insertion sign-off and is repeated whenever the netlist changes after sign-off.
Every pattern set the program needs exists in the tester's format and has passed simulation against the final netlist with tester timing, with the fault coverage it achieves recorded against the goal.
13 more sections for registered members.