Process · Test & DFT
Trim
Measuring a circuit's actual behaviour at test and programming correction codes into fuses or registers so that references, oscillators, ADC gains and offsets meet specification.
It compensates for process variation that design alone cannot remove.
- Also known as
- Trimming
- Type
- Process
- Domain
- Test & DFT, Test flow and operations
Notes
Usually done at wafer sort, then optionally re-trimmed at final test because packaging stress shifts analog parameters.
Related terms
Part of the Test & DFT glossary, with every term in the topic and the lifecycles, tools and standards that use them.
Where it appears on the Hub
No other page of the Hub uses this term yet.
Suggest an improvement
Suggest an improvement to this entry
A clearer definition, an example, a correction or a source an editor can check. Editors review every suggestion before the entry changes.
Last reviewed: not yet reviewed in depth. Entry last updated . The full glossary