Term · Fab Ops, Yield & Metrology
Negative binomial yield model
A defect-limited yield model that adds a clustering parameter alpha to defect density, so that spatially bunched defects are not double-counted. It fits observed large-die yields far better than Poisson.
- Also known as
- Clustered yield model, Stapper model
- Type
- Term
- Domain
- Fab Ops, Yield & Metrology, Yield modelling
Notes
Smaller alpha means stronger clustering; values around 2 to 5 are typical fits for logic processes.
Related terms
- Poisson yield model
- D0
- Clustering parameter
- Die yield
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