This thread is for discussing the lifecycle document "Fault injection sign-off: gate review pack".
The review at which functional verification is complete and fault injection campaigns show the mitigation behaves as the architecture claims, with every unprotected sensitivity explained, accepted or fixed, interface conformance checked in simulation and the rate prediction updated. For verification, fault injection and radiation effects leads.
Read the document: https://www.thesemiconhub.com/lifecycle/space/gates/spc-fault-injection-signoff/document
Point out anything that is wrong, unclear or missing, and say which section you mean. Reviewers read this thread when they audit the document.