This thread is for discussing the lifecycle document "Test End of Life: stage guide".
How the test side of a product is closed: capacity and spare hardware for the last-time buy, the final test runs, and an archive of the program, patterns, hardware design data and test data kept for the agreed retention period. For product, operations and quality engineers.
Read the document: https://www.thesemiconhub.com/lifecycle/test-program/tp-end-of-life/document
Point out anything that is wrong, unclear or missing, and say which section you mean. Reviewers read this thread when they audit the document.